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30 A, 10 MHz Current Probe - AC/DC, 30 A rms, 50 A Peak Pulse, 3 Meter Cable
CP030-3M
Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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67 GHz Test Port Extension Cables
Spanawave's test port extension cables are the perfect alternative to over-priced models from other manufacturers. These test cables provide the utmost precision in vector measurements in the lab and during calibrations. Besides the electrical performance, these VNA cables are rugged and feature a lightweight armor to insure consistent performance over time. A wide variety of connectors are available including the precision "NMD" or "port ruggedized" connectors, which mate directly to the VNA port. Custom lengths and configurations are available. Please contact us for application help and pricing.
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring u...show more -
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PCIe-6374, 4 AI (16-Bit, 3.5 MS/s/ch), 2 AO, 24 DIO, Multifunction I/O Device
785817-01
The PCIe‑6374 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6374 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the teleco...show more -
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Digital Acquisition Benchtop System
Reliable and repeatable switching is critical for your measurement accuracy whether you use switching to route signals for design verification applications or for complex automated functional test systems. Keysight's switch measure mainframe and modules help ensure confidence in your measurement results.
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PXIe-1083, 5-Slot (5 Hybrid Slots), Up to 2 GB/s PXI Chassis
787026-01
PXIe, 5-Slot (5 Hybrid Slots), Up to 2 GB/s PXI Chassis - The PXIe‑1083 features a high-bandwidth, all-hybrid backplane to meet high-performance test and measurement application needs. This PXI chassis features all hybrid connectors, 58 W power and cooling, and an integrated … Thunderbolt 3 MXI-Express controller.
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Test Signal Generators
MicroImage Video Systems has a broad array of video test signal and color bar?generators designed for many applications from laboratory and testing to embedded systems. MicroImage Video Systems can design a video test signal generator for your applications. In fact, we have designed many more custom test signal generators that we offer as standard products. Small size is important and our video test signal generators start at just 1.5 inches square.
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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FPGA PXI Card with 40 Channel ECL Buffer Module
GX3640
The GX3640 is comprised of the GX3500 FPGA card and the GX3540, 40 channel ECL expansion card. It is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), and functional test applications. The GX3640 consists of 20 differential ECL drivers and 20 differential ECL receivers. Each channel can be accessed via software commands for use in static I/O applications.
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PXI High Density Precision Resistor Module, 18-Channel, 2Ω to 31.5Ω
40-298-010
The 40-298-010 is a high density programmable resistor module with 18 channels which can be set between 2Ω and 31.5Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Micro-Ohmmeters
Micro-Ohmmeter is an affordable 7 range, 4-Wire Kelvin based product that is used to test electrical resistance on a wide variety of applications including winding resistance, contact resistance, and component testing. The 720A micro-ohmmeter has an autorange feature (available with NSN package) and is compatible with an RS232C interface (OP-232). Thanks to its wide-range capabilities, ease of use, and CE mark, this micro-ohmmeter is used commonly across the globe.
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PXIe-4135, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-01
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and ...show more -
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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PXIe-6614, 5 V, 8-Channel, Precision Reference PXI Counter/Timer Module
782353-01
PXIe, 5 V, 8-Channel, Precision Reference PXI Counter/Timer Module—The PXIe‑6614 is a high-precision counter/timer module that performs encoder position measurement, event counting, period measurement, pulse-width measurement, pulse generation, pulse-train generation, and frequency measurement. It features eight counter/timers, digital debouncing filters, and TTL/CMOS‑compatible digital I/O. The PXIe‑6614 offers industrially rugged features for a wide array of applications such as automotive/ae...show more -
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Fibre Channel PXI Express Test & Simulation Instrument
PXIe-FC4
Avionics Interface Technologies
3U PXIe form factor will fit into any PXIe or hybrid slot - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Triggering and Filtering - Error Injection on any Header or Payload Parameter - Data Capture to on-board memory or disk file - Live Capture and Curren...show more -
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Custom Test System Solutions
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Benchtop Communication Test System
ATS3000A
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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PXI 2.5W Programmable Resistor Module, 8-Channel, 1Ω to 470Ω
40-251-014
The 40-251-014 is a programmable resistor module with 8 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
